A team from the University of Massachusetts and University of California studied the seeded growth of tetrapropulammonium (TPA)-silicalite-1 using simulations and dynamic light scattering (DLS), atomic force microscopy and transmission electron microscopy procedures. DLS was used to monitor as well as study the size and growth of silicalite seeds using Brookhaven Instruments’ BI200SM goniometer system.
Results of the study published in Chemical Materials support the possibility that under the set conditions, the silicalite seed growth proceeds by a process with the rate-ceiling step that involves the addition of subcolloidal particles. With the goal of understanding the mechanism behind subcolloidal interactions that may affect the growth of zeolite particles, Vladimiros Nikolakis and his team systematically experimented on methods and executed chemical approaches, where DLS was applied through the Brookhaven BI200SM goniometer.
The seeds were studied under different temperatures and underwent more tests plus analysis, leading the researchers to conclude the rate-limiting step for silicalite growth is indeed subcolloidal particle addition.
Brookhaven offers high-quality particle analyzers for demanding applications such as this. The BI-200SM Goniometer performs optimal DLS for all relevant applications. This quality goniometer from Brookhaven is only one of the manufacturer’s premier particle size analyzers.