High Resolution Particle Size Analysis
By providing both centrifugal and gravitational sedimentation in one instrument, the BI-XDC brings these well established methods of particle sizing up to date with today’s fine particle technology. With an X-ray technology to give error free measurements, fast and accurate size distributions across the “one-micron” transition region are easily obtained. Now, with a single instrument you can get true high resolution, accurate particle size distributions from 10 nanometers right up to 100 microns. Brookhaven’s advanced scanning detector technology and wide disc speed range lets you optimize analysis times and broaden the range of samples you can analyze.
With the Brookhaven BI-XDC there are no optical corrections and no optical properties to worry about, just a simple mass sensitive response based on X-ray absorption.
Typical runs take 3-30 minutes and are dependent upon the particle size range to be determined. Real-time progress of the experiment is plotted on the screen. Standard plots include differential and cumulative distributions of particle sizes weighted by volume, surface area and number on linear and logarithmic scales. Up to six plots can be overlaid for comparisons and additional tabular and other choices of display provide customized reports for a wide variety of purposes including SPC charts. A menu of data files allows easy analysis of multiple experiments.
Features at a glance
- Accurate and quantitative
- Resolves mixtures
- X-ray detection – no optical corrections
- Range 10 nm to 100 µm
- Scanning head for high speed
- Simple operation
- Clear text and graphical reports